X-ray scattering is used extensively to provide detailed structural information about materials. Semiconductors have benefited from X-ray scattering techniques as an essential feedback method for crystal growth, including compositional and thickness determination of thin layers. The methods have been developed to reveal very detailed structural information concerning material quality, interface structure, relaxation, defects, surface damage, etc.This book provides a thorough description of the techniques involved in obtaining that information, including X-ray diffractometers and their associated instrument functions, data collection methods, and the simulation of the diffraction patterns observed. Also presented are examples and procedures for interpreting the data to build a picture of the sample, much of which will be common to materials other than semiconductors.
Betal enkelt med kort, Klarna, Apple Pay eller Google Pay. Ikke fornøyd? Du har alltid 14 dagers angrerett. Les mer i våre vilkår. Har du spørsmål, send oss en e-post på hello@memmo.org.
Memmo gjør det enklere å studere – uansett hvor du er i verden. Hos oss samler du pensumbøker og smarte studieverktøy på ett og samme sted: sammendrag, quizer, podkaster og flashcards. Og så Ted, din studiekompis som svarer på alt du lurer på. Over 50 000 studenter studerer allerede her – bygget for at du skal lære raskere og stresse mindre.
Du vil kanskje også like
Kjøp boken0