ATOMIC FORCE MICROSCOPY: A CONCISE INTRODUCTION

This book offers a comprehensive and accessible introduction to atomic force microscopy (AFM) — a fundamental technique in nanoscience, nanotechnology, and materials characterization. While the basic operating principle of AFM is straightforward, the processes of data acquisition, quantitative analysis, and interpretation require deeper scientific understanding.

Designed for readers with a first-year university background in mathematics and physics, this text builds a strong foundation for mastering both the practical and theoretical aspects of AFM.

Contents:

• Dedication
• Foreword
• Preface
• Acknowledgements
• Instrumentation:
  • Context and Overview of Instrumentation
  • Difficulties of Imaging
  • Other SPMs and AFM Imaging Modes
  • AFM Design and Calibration
• Interpretation:
  • Force-Curve Mechanics
  • Tip-Sample Interactions
  • Oscillator Models for AFM
• Appendices:
  • Compiled Learning Objectives
  • General Plan of an AFM Experiment
  • Electronic Supplement
  • List of Acronyms
  • List of Symbols
• Answers
• Index

Readership: Both academia and industry: Researchers and students new to atomic force microscopy; Researchers and students who want to more deeply understand atomic force microscopy and develop their skills; Readers with backgrounds at the first-year university level of mathematics and physics will be able to follow the first six chapters of the text. For the seventh chapter, previous exposure to differential equations and complex numbers is useful.