Surveying and comparing all techniques relevant for practical applications in surface and thin film analysis, this second edition of a bestseller is a vital guide to this hot topic in nano- and surface technology. This new book has been revised and updated and is divided into four parts - electron, ion, and photon detection, as well as scanning probe microscopy. New chapters have been added to cover such techniques as SNOM, FIM, atom probe (AP),and sum frequency generation (SFG). Appendices with a summary and comparison of techniques and a list of equipment suppliers make this book a rapid reference for materials scientists, analytical chemists, and those working in the biotechnological industry.
From a Review of the First Edition (edited by Bubert and Jenett)
"... a useful resource..."
(Journal of the American Chemical Society)
From a Review of the First Edition (edited by Bubert and Jenett)
"... a useful resource..."
(Journal of the American Chemical Society)
Betaal eenvoudig met kaart, Klarna, Apple Pay of Google Pay. Niet tevreden? Je hebt altijd 14 dagen bedenktijd. Lees meer in onze voorwaarden. Heb je vragen, mail ons dan via hello@memmo.org.
Memmo maakt studeren makkelijker – waar je ook bent ter wereld. Wij brengen je cursusboeken en slimme studietools samen op één plek: samenvattingen, quizzen, podcasts en flashcards. En Ted, je studievriend die antwoord geeft op alles wat je je afvraagt. Meer dan 50.000 studenten studeren hier al – gebouwd om je sneller te laten leren en minder stress te geven.