Electron Microscopy and Analysis

Electron Microscopy and Analysis

Auteur: John Humphreys, Peter J. Goodhew, Richard Beanland
Uitgever: CRC Press
Editie: 3
Publicatiedatum: 2000
ISBN: 9781032291956

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Electron Microscopy and Analysis deals with several sophisticated techniques for magnifying images of very small objects by large amounts - especially in a physical science context. It has been ten years since the last edition of Electron Microscopy and Analysis was published and there have been rapid changes in this field since then. The authors h

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