Random Non-Random Periodic Fau

Random Non-Random Periodic Fau

Autore: M. T. Sebastian, P. Krishna
Editore: CRC Press
Edizione: 1
Data di pubblicazione: 2017
ISBN: 9782881249259

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This book provides a comprehensive overview of stacking faults in crystal structures. Subjects covered include: notations used in representations of close-packed structures; types of faults; methods of detection and measurement such as X-ray diffraction, electron diffraction and other techniques; theoretical models of non-random faulting during phase transitions; specific examples of - close packed structures including, zinc sulphide, silicon carbide and silver iodide.

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