Research for Practical Issues and Solutions in Computerized Multistage Testing

Research for Practical Issues and Solutions in Computerized Multistage Testing

Autore: Alina A. von Davier, Duanli Yan, David J. Weiss
Editore: Taylor & Francis
Edizione: 1
Data di pubblicazione: 2024
ISBN: 9780367207816

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This volume presents a comprehensive collection of the latest research findings supporting the current and future implementations and applications of computerized multistage testing (MST).

As a sequel to the widely acclaimed Computerized Multistage Testing: Theory and Applications (2014) by Yan, von Davier, and Lewis, this volume delves into the experiences, considerations, challenges, and lessons learned over the past years. It also offers practical approaches and solutions to the issues encountered. The topics covered include purposeful MST designs, practical approaches for optimal design, assembly strategies for accuracy and efficiency, hybrid designs, MST with natural language processing, practical routing considerations and methodologies, item calibration and proficiency estimation methods, routing and classification accuracy, added value of process data, prediction and evaluation of MST performance, cognitive diagnostic MST, differential item functioning, robustness of statistical methods, simulations, test security, the new digital large-scale Scholastic Aptitude Test, software for practical assessment and simulations, artificial intelligence impact, and the future of adaptive MST.

This volume is intended for students, faculty, researchers, practitioners, and education officers in the fields of educational measurement and evaluation in the United States and internationally.

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