Surveying and comparing all techniques relevant for practical applications in surface and thin film analysis, this second edition of a bestseller is a vital guide to this hot topic in nano- and surface technology. This new book has been revised and updated and is divided into four parts - electron, ion, and photon detection, as well as scanning probe microscopy. New chapters have been added to cover such techniques as SNOM, FIM, atom probe (AP),and sum frequency generation (SFG). Appendices with a summary and comparison of techniques and a list of equipment suppliers make this book a rapid reference for materials scientists, analytical chemists, and those working in the biotechnological industry.
From a Review of the First Edition (edited by Bubert and Jenett)
"... a useful resource..."
(Journal of the American Chemical Society)
From a Review of the First Edition (edited by Bubert and Jenett)
"... a useful resource..."
(Journal of the American Chemical Society)
Betal nemt med kort, Klarna, Apple Pay eller Google Pay. Ikke tilfreds? Du har altid 14 dages fortrydelsesret. Læs mere i vores vilkår. Har du spørgsmål, så send os en mail på hello@memmo.org.
Memmo gør det nemmere at studere – uanset hvor du er i verden. Hos os samler du dine kursusbøger og smarte studieværktøjer ét sted: resuméer, quizzer, podcasts og flashcards. Og så er der Ted, din studieven, der svarer på alt, du undrer dig over. Over 50 000 studerende studerer allerede her – bygget til at hjælpe dig med at lære hurtigere og stresse mindre.