With the growing proliferation of nanotechnologies, powerful imaging technologies are being developed to operate at the sub-nanometer scale. The newest edition of a bestseller, the Handbook of Charged Particle Optics, Second Edition provides essential background information for the design and operation of high resolution focused probe instruments.
The book’s unique approach covers both the theoretical and practical knowledge of high resolution probe forming instruments. The second edition features new chapters on aberration correction and applications of gas phase field ionization sources. With the inclusion of additional references to past and present work in the field, this second edition offers perfectly calibrated coverage of the field’s cutting-edge technologies with added insight into how they work.
Written by the leading research scientists, the second edition of the Handbook of Charged Particle Optics is a complete guide to understanding, designing, and using high resolution probe instrumentation.
Betal nemt med kort, Klarna, Apple Pay eller Google Pay. Ikke tilfreds? Du har altid 14 dages fortrydelsesret. Læs mere i vores vilkår. Har du spørgsmål, så send os en mail på hello@memmo.org.
Memmo gør det nemmere at studere – uanset hvor du er i verden. Hos os samler du dine kursusbøger og smarte studieværktøjer ét sted: resuméer, quizzer, podcasts og flashcards. Og så er der Ted, din studieven, der svarer på alt, du undrer dig over. Over 50 000 studerende studerer allerede her – bygget til at hjælpe dig med at lære hurtigere og stresse mindre.